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x-ray photoelectron spectroscopy
x-ray photoelectron spectroscopy
Morphological, chemical and structural characterisation of deciduous enamel: SEM, EDS, XRD, FTIR and XPS analysis
Authors:
C. M. Zamudio-Ortega
,
R. Contreras-Bulnes
,
R. J. Scougall-Vilchis
,
R. A. Morales-Luckie
,
O. F. Olea-Meja
,
L. E. Rodrguez-Vilchis
Publication date:
Sep/2014
Volume:
15
Pag:
275– 280
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