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x-ray diffraction

Morphological, chemical and structural characterisation of deciduous enamel: SEM, EDS, XRD, FTIR and XPS analysis

Authors: C. M. Zamudio-Ortega, R. Contreras-Bulnes, R. J. Scougall-Vilchis, R. A. Morales-Luckie, O. F. Olea-Meja, L. E. Rodrguez-Vilchis

Publication date: Sep/2014Volume: 15 Pag: 275– 280

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Editor in chief: dott. Luigi Paglia
European Journal of Paediatric Dentistry © | ISSN (Online): 2035-648X
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European Journal of Paediatric Dentistry © | ISSN (Online): 2035-648X
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